This application refers to the shielding of magnetic fields generated by a complex power substation on a test area
where sensitive electronic devices are installed. Such devices are employed in a semiconductor industry for the wafer
testing and very low electrical currents are measured (in the order of femto-Amperes). External magnetic fields have
to be low enough in order to not disturb the current measurements.
Level of 0.2 – 0.3 microT are usually required in the environment where the testing machines are placed.
Some preliminary measurements show a magnetic pollution in the testing close to 2-3 microT. Such value is quite
constant because the substation works 24 hours a day at constant load. A shielding factor of at least 10 is required.
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